ABSTRACT: In this article, we present a new technique to measure the static dielectric constant which was
developed using atomic force microscopy (AFM) system. This technique is polarizability that is produced due to
a low-frequency electric field. In addition, it is due to both permanent dipoles in the material and induced
dipoles. Our goal was to show some physical, measurable quantity by Atomic Force Microscopy that can be
related to the dielectric constant and our method was tested on a material whose dielectric constant is known
such as strontium titanate and mica. The advantage of this method is that it does not require using the complex
simulations that depend on the geometry of probe tip which is complicated and difficult to characterize.
[1]. Crider, P.S. Majewski, M.R. Zhang, J. Oukris, H. and N. E. Israeloff, N.E.(2007), Local Dielectric Spectroscopy of Polymer Films,
Appl. Phys. Lett.3013102.
[2]. Crider, P.S. Majewski, M.R. Zhang, J. Oukris, H. and Isrealoff, N.E.(2008) Local Dielectric Spectroscopy of Near-Surface Glassy
Polymer Dynamics, J. Chem. Phys. 128, 044908−044908-5.
[3]. Riedel,C. Arinero, R. Tordjeman, P.H. Ramonda, M .G. Lévêque, G. Schwartz, A. Oteyza, D. G. Alegria, A.A. and Colmenero,
J.(2009), Determination of the Nano scale Dielectric Constant by Means of a Double Pass Method Using Electrostatic Force
Microscopy, J. Appl. Phys, 106 , 024315.
[4]. Reynier Revilla,I. Li.Xiao-Jun, yang-Lian Yang, and Chen wang.(2013), Comparative Method to Quantify Dielectric Constant at
Nanoscale Using Atomic Force Microscopy, J. Physical Chem.118 , 1-22.
[5]. Fumagalli, L. Ferrari, G. Sampietro, M. and Gomila, G.(2007), Dielectric-Constant Measurement of Thin Insulating Films at Low
Frequency by Nanoscale Capacitance Microscopy, Appl. Phys. Lett, 91, 243110